Title :
Reliability and sensitivity analysis of imperfect coverage multi-state systems
Author :
Shrestha, Akhilesh ; Xing, Liudong ; Amari, Suprasad V.
Author_Institution :
ARCON Corp., Waltham, MA, USA
Abstract :
A multi-state system (MSS) is a system in which both the system and its components may exhibit multiple performance levels (or states) varying from perfect operation to complete failure. MSS are usually designed with sufficient redundancies. However, the recovery mechanisms can fail such that an uncovered fault can propagate through the system, and lead to an entire system failure. This phenomenon is known as imperfect coverage (IPC). In this paper, we propose a combinatorial methodology based on multi-state multi-valued decision diagrams (MMDD) and conditional probability for the reliability and sensitivity/importance analysis of MSS subject to IPC. The advantages and application of the MMDD-based method will be illustrated through analysis of an example MSS subject to IPC.
Keywords :
combinatorial mathematics; decision diagrams; probability; reliability theory; sensitivity analysis; combinatorial methodology; conditional probability; imperfect coverage phenomenon; multiple performance levels; multistate multivalued decision diagrams; multistate systems; recovery mechanisms; reliability analysis; sensitivity analysis; Circuit faults; Computer network reliability; Degradation; Independent component analysis; Power generation; Power system modeling; Power system reliability; Redundancy; Sensitivity analysis; Telecommunication network reliability; imperfect fault coverage; multi-state multi-valued decision diagram; multi-state system; sensitivity analysis;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
DOI :
10.1109/RAMS.2010.5448066
