• DocumentCode
    2085113
  • Title

    A New Approach of the Source Method for Characterization of Planar Structures

  • Author

    Pujol, S. ; Baudrand, H. ; Hanna, V.Fouad ; Dong, X.

  • Author_Institution
    ENSEEIHT-LMO 2, rue C. Camichel 31071 TOULOUSE, Cedex FRANCE
  • Volume
    2
  • fYear
    1991
  • fDate
    9-12 Sept. 1991
  • Firstpage
    1015
  • Lastpage
    1020
  • Abstract
    An analysis of planar circuits using the source method is presented. The definition of the input impedance seen from the source shows the arbitrary nature of the current source. An homographical relation, which relates the computed values to the true values of the input impedance, is demonstrated. Coupling two-port networks are introduced between the source and the access line of the circuit. The scattering parameters of a microstrip step discontinuity are given as an example.
  • Keywords
    Circuit analysis; Conductors; Coupling circuits; Current density; Microstrip; Scattering parameters; Surface impedance; Surface waves; Tellurium; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1991. 21st European
  • Conference_Location
    Stuttgart, Germany
  • Type

    conf

  • DOI
    10.1109/EUMA.1991.336479
  • Filename
    4136419
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2085113