Title :
Image segmentation algorithm based on statistical pattern recognition methods
Author :
Strzecha, Krzysztof
Author_Institution :
Comput. Eng. Dept., Tech. Univ. Lodz, Poland
Abstract :
Presents a newly developed segmentation algorithm, based on k-NN statistical pattern recognition rule. This algorithm uses arbitrary surface description as the primitive and can be described as a region growing method.
Keywords :
image segmentation; pattern classification; statistical analysis; arbitrary surface description; image segmentation algorithm; k-NN rule; k-nearest neighbours classification; primitives; region growing method; statistical pattern recognition methods; Computer vision; Image color analysis; Image edge detection; Image processing; Image segmentation; Image sensors; Machine vision; Pattern recognition; Remotely operated vehicles; Surface fitting;
Conference_Titel :
CAD Systems in Microelectronics, 2001. CADSM 2001. Proceedings of the 6th International Conference. The Experience of Designing and Application of
Conference_Location :
Lviv-Slavsko, Ukraine
Print_ISBN :
966-553-079-8
DOI :
10.1109/CADSM.2001.975807
