Title :
A smart CMOS interface system for thermocouples
Author :
Khadouri, Saleh H. ; Van Der Goes, Frank bl L ; Meijer, Gerard C M
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
This paper presents a novel interface for voltage-generating sensors, such as thermopiles and thermocouples. The processor converts sequentially a DC input. Voltage and three internally generated voltages into a period-modulated square-wave output signal. The internal signals are required to provide auto-calibration for offset and gain and to measure the interface internal temperature. Dynamic element matching is applied to generate an accurate and reliable PTAT voltage. The applied modulator used in the circuit has a 2nd-order filtering which suppresses low-frequency (1/f) noise. This filtering property enables the use of a low-cost CMOS process for the implementation of the circuit. The interface is able to measure a voltage (Vx) in the range of -27 mV to 100 mV, the measured accuracy of the system over a temperature range of -25°C to 75°C is 550 ppm of Vx. The inaccuracy in determining the reference-junction temperature amounts to 0.6 K. The measuring time is ⩽50 ms
Keywords :
1/f noise; CMOS integrated circuits; calibration; computerised instrumentation; interference suppression; signal processing; signal processing equipment; temperature measurement; thermocouples; thermopiles; voltage measurement; -25 to 75 C; -27 to 100 mV; 1/f noise; 2nd-order filtering; 50 ms; DC input; autocalibration; dynamic element matching; interface internal temperature; internally generated voltages; low-cost CMOS process; low-frequency noise; measured accuracy; period-modulated square-wave output signal; reference-junction temperature; smart CMOS interface; thermocouples; thermopiles; voltage-generating sensors; CMOS process; Circuit noise; Filtering; Gain measurement; Intelligent sensors; Low-frequency noise; Signal generators; Temperature sensors; Thermal sensors; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507471