Title :
Failure diagnosis of discrete event systems with linear-time temporal logic fault specifications
Author :
Jiang, Shengbing ; Kumar, Ratnesh
Author_Institution :
Dept. of Electr. & Comput. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
The failure diagnosis problem of discrete event systems with linear-time temporal logic specifications is studied. Diagnosability of discrete event systems in the temporal logic setting is defined. The problem of testing diagnosability is reduced to the problem of model checking. An algorithm for the test of diagnosability and the synthesis of a diagnoser is obtained.
Keywords :
computational complexity; discrete event systems; fault diagnosis; formal verification; temporal logic; diagnosability; discrete event systems; failure diagnosis; linear-time temporal logic fault specifications; model checking; Computer science; Condition monitoring; Control system synthesis; Discrete event systems; Fault diagnosis; Formal languages; Logic testing; Natural languages; Reliability engineering; System testing;
Conference_Titel :
American Control Conference, 2002. Proceedings of the 2002
Print_ISBN :
0-7803-7298-0
DOI :
10.1109/ACC.2002.1024792