Title :
Visual evoked potentials for attentional gating in a brain-computer interface
Author :
Geronimo, A. ; Schiff, S.J. ; Kamrunnahar, Mst
Author_Institution :
Pennsylvania State Univ., University Park, PA, USA
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
For synchronous brain-computer interface (BCI) paradigms tasks that utilize visual cues to direct the user, the neural signals extracted by the computer are representative of voluntary modulation as well as evoked responses. For these paradigms, the evoked potential is often overlooked as a source of artifact. In this paper, we put forth the hypothesis that cue priming, as a mechanism for attentional gating, is predictive of motor imagery performance, and thus a viable option for self-paced (asynchronous) BCI applications. We approximate attention by the amplitude features of visually evoked potentials (VEP)s found using two methods: trial matching to an average VEP template, and component matching to a VEP template defined using independent component analysis (ICA). Templates were used to rank trials that display high vs. low levels of fixation. Our results show that subject fixation, measured by VEP response, fails as a predictor of successful motor-imagery task completion. The implications for the BCI community and the possibilities for alternative cueing methods are given in the conclusions.
Keywords :
brain-computer interfaces; independent component analysis; visual evoked potentials; attentional gating; brain-computer interface; cue priming; independent component analysis; motor imagery performance; neural signal; self paced BCI; synchronous BCI paradigm; visual evoked potential; Computers; Correlation; Electroencephalography; Independent component analysis; Standards; Synchronous motors; Visualization; Adolescent; Adult; Attention; Brain-Computer Interfaces; Evoked Potentials, Visual; Fixation, Ocular; Humans; Male; Task Performance and Analysis; Young Adult;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6346286