Title :
Merit Figures of Low Noise HEMTs from Complete Characterization
Author :
Capponi, G. ; Maio, B. Di ; Livreri, P. ; Martines, G.
Author_Institution :
"Dipartimento di Ingegneria Elettrica", Viale delle Scienze, 90128 Palermo - ITALY
Abstract :
A number of HEMT from different manufacturers have been completely characterized by means of a noise figure automatic test set. A thorough performance evaluation of the HEMT families has been carried out and the results are reported as distributions of compact figures of merit applicable in amplifier design.
Keywords :
Frequency measurement; Gain measurement; HEMTs; Loss measurement; MODFETs; Microwave measurements; Noise figure; Noise measurement; Power measurement; Scattering parameters;
Conference_Titel :
Microwave Conference, 1991. 21st European
Conference_Location :
Stuttgart, Germany
DOI :
10.1109/EUMA.1991.336538
