Title :
Burn-in tests for reliability assurance of semiconductor devices used in life qualified equipment
Author :
Galateanu, Lucian ; Baicu, Floarea ; Boboc, Dan
Author_Institution :
Nat. Inst. Inst. for Microtechnol., Bucharest, Romania
Abstract :
A design method of the burn-in tests which assure the fulfilment by the aged semiconductor devices of the reliability specifications required for using in life qualified equipment is introduced. The different acceleration by temperature for different failure mechanism populations is taken into account. A solution for successive picking out of the ageing test conditions, for the iterative finding of the optimum situation, is given
Keywords :
failure analysis; life testing; semiconductor device reliability; semiconductor device testing; accelerated ageing test; aged semiconductor devices; ageing test conditions; burn-in tests; design method; failure mechanism populations; iterative finding; life qualified equipment; optimum situation; picking out; reliability assurance; reliability specifications; semiconductor devices; Accelerated aging; Design methodology; Failure analysis; Life estimation; Life testing; Semiconductor device reliability; Semiconductor device testing; Semiconductor devices; Temperature; Thermal resistance;
Conference_Titel :
Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-3804-9
DOI :
10.1109/SMICND.1997.651038
