Burn-in tests for reliability assurance of semiconductor devices used in life qualified equipment

Author

Galateanu, Lucian ; Baicu, Floarea ; Boboc, Dan

Author_Institution

Nat. Inst. Inst. for Microtechnol., Bucharest, Romania

Volume

2

fYear

1997

fDate

7-11 Oct 1997

Firstpage

327

Abstract

A design method of the burn-in tests which assure the fulfilment by the aged semiconductor devices of the reliability specifications required for using in life qualified equipment is introduced. The different acceleration by temperature for different failure mechanism populations is taken into account. A solution for successive picking out of the ageing test conditions, for the iterative finding of the optimum situation, is given

Keywords

failure analysis; life testing; semiconductor device reliability; semiconductor device testing; accelerated ageing test; aged semiconductor devices; ageing test conditions; burn-in tests; design method; failure mechanism populations; iterative finding; life qualified equipment; optimum situation; picking out; reliability assurance; reliability specifications; semiconductor devices; Accelerated aging; Design methodology; Failure analysis; Life estimation; Life testing; Semiconductor device reliability; Semiconductor device testing; Semiconductor devices; Temperature; Thermal resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International

Conference_Location

Sinaia

Print_ISBN

0-7803-3804-9

Type

conf

DOI

10.1109/SMICND.1997.651038

Filename

651038