Title :
Developed tools for an optimization approach, application to optimize a flyback structure volume under EMC and loss constraints
Author :
Larouci, Chérif ; Atienza, Eric ; Ferrieux, Jean-Paul ; Gerbaud, Laurent ; Roudet, James
Author_Institution :
Lab. d´´Electrotech. de Grenoble, CNRS, St. Martin d´´Heres, France
Abstract :
The paper deals with a methodology to size and optimize static converters using a gradient optimization algorithm. Generally, these static converters are described by semi-analytical models (both symbolic and numerical models). These models are built from stair functions (manufacturer data to evaluate the volume and the losses in the transformer) or from complex series to calculate the low frequency spectrum and the electromagnetic compatibility (EMC) spectrum, or from real series to calculate the semiconductor losses. That generates a strong discontinuity of the functions and their derivatives. To avoid these constraints, the authors have developed generic tools to carry out each kind of constraint with a gradient optimization algorithm. These tools are integrated in an optimization software and used to carry out an optimization process. The developed approach is applied to optimize the volume of a flyback structure in a power factor correction (PFC) mode, to respect EMC standards and to minimize the whole losses in this structure. The optimization results are validated thanks to a measurement workbench
Keywords :
DC-DC power convertors; electromagnetic compatibility; gradient methods; losses; optimisation; power factor correction; EMC; STAIRS tool; complex series; core loss model; discontinuity; electromagnetic compatibility spectrum; flyback structure volume; generic tools; gradient optimization algorithm; loss constraints; losses; low frequency spectrum; numerical models; optimization; power factor correction mode; semi-analytical models; semiconductor losses; static converters; symbolic models; Constraint optimization; Electromagnetic compatibility; Electromagnetic modeling; Frequency; Numerical models; Optimization methods; Power factor correction; Semiconductor device manufacture; Software tools; Virtual manufacturing;
Conference_Titel :
Industrial Electronics Society, 2001. IECON '01. The 27th Annual Conference of the IEEE
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-7108-9
DOI :
10.1109/IECON.2001.975865