Surface properties of artificially contaminated polymeric cable terminations

Author

Sundararajan, Raji ; Madhavan, Sudeesh ; Lynch, Mike ; Sundhar, Sri

Author_Institution

Dept. of Electron. & Comput. Eng. Technol., Arizona State Univ., Mesa, AZ, USA

Volume

1

fYear

1997

fDate

19-22, Oct 1997

Firstpage

362

Abstract

Low voltage surface resistance measurement and Scanning Probe Microscopy (SPM) have been used to investigate the surface recovery properties of artificially contaminated polymeric cable terminations. Due to the basic functionality difference between cable terminations and insulators, it will be of practical interest to investigate the surface recovery properties of polymeric cable terminations under contaminated conditions. Results show that the surface resistance increases with increase in the recovery period and the sophisticated SPM surface analysis technique is useful in quantifying the surface roughness of the samples at various stages

Keywords

atomic force microscopy; electric connectors; insulator contamination; insulator testing; polymer insulators; recovery; silicone rubber insulators; surface conductivity; surface topography; SPM surface analysis technique; artificially contaminated polymeric cable terminations; contact AFM technique; insulators; low voltage surface resistance measurement; scanning probe microscopy; silicone rubber; surface properties; surface recovery properties; surface roughness; Cable insulation; Electrical resistance measurement; Low voltage; Plastic insulation; Polymers; Rough surfaces; Scanning probe microscopy; Surface contamination; Surface resistance; Surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on

Conference_Location

Minneapolis, MN

Print_ISBN

0-7803-3851-0

Type

conf

DOI

10.1109/CEIDP.1997.634633

Filename

634633