DocumentCode
2086940
Title
The effect of iso-thermal aging on vibrational performance of SAC 105 and 305 alloys
Author
Vijayakumar, N. ; Thirugnanasambandam, Sivasubramanian ; Soobramaney, P. ; Jiawei Zhang ; Sanders, T. ; Evans, Joseph ; Flowers, G. ; Bozack, M.
Author_Institution
Center for Adv. Vehicle & Extreme Environ. Electron., Auburn Univ., Auburn, AL, USA
fYear
2013
fDate
Feb. 27 2013-March 1 2013
Firstpage
69
Lastpage
81
Abstract
Ball grid array (BGA) packages have rapidly become the popular choice of manufacturers in the semiconductor industry over the past decade. The characteristics of BGA packages in a vibration environment have a deleterious effect after long term isothermal aging. The effectiveness of this characteristics was demonstrated with promising results through vibration testing of SAC 105 and 305 alloys. This experiment focuses on the vibration fatigue life of 10 mm, 15 mm and 19 mm BGA solder-joints at aging temperatures of 55°C for 6, 12 and 24 months. The deleterious effect of the on the characteristic fatigue lifetime is reported. The results show that the aging time has a direct impact on the total time to failure. The results show that the Time-To-Failure (TTF) of the solder joint decreases with aging. A step stress test approach was taken in selecting a vibration profile for the study in order to reduce the duration of the test with most failures and as to record the failure more precisely over aging across 6,12 and 24 months. The paper concludes with discussion of the deterioration intensity aging has on SAC alloys and the change in reliability over time. The results obtained in this work show that there is a significant deleterious effect on the mechanical strength of SAC alloy solder balls during elevated temperature aging. The data demonstrate that the low-silver-content alloy (SAC105) is more sensitive to elevated temperature aging.
Keywords
ageing; ball grid arrays; fatigue testing; solders; 305 alloys; BGA packages; BGA solder-joints; SAC 105 alloys; aging temperatures; aging time; ball grid array packages; deterioration intensity aging; elevated temperature aging; fatigue lifetime; iso-thermal aging; low-silver-content alloy; mechanical strength; semiconductor industry; size 10 mm; size 15 mm; size 19 mm; solder balls; step stress test approach; temperature 55 C; time 12 month; time 24 month; time 6 month; time-to-failure; vibration environment; vibration fatigue life; vibration profile; vibration testing; vibrational performance; Joints; Materials; Resistors; Soldering; Stress; Vehicles; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials (APM), 2013 IEEE International Symposium on
Conference_Location
Irvine, CA
ISSN
1550-5723
Print_ISBN
978-1-4673-6093-7
Electronic_ISBN
1550-5723
Type
conf
DOI
10.1109/ISAPM.2013.6510389
Filename
6510389
Link To Document