Title :
A study of solder alloy ductility for cryogenic applications
Author :
Lupinacci, A. ; Shapiro, A.A. ; Suh, J.O. ; Minor, A.M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Univ. of California, Berkeley, Berkeley, CA, USA
fDate :
Feb. 27 2013-March 1 2013
Abstract :
For aerospace applications it is important to understand the mechanical performance of components at the extreme temperature conditions seen in service. For solder alloys used in microelectronics, cryogenic temperatures can prove problematic. At low temperatures Sn-based solders undergo a ductile to brittle transition that leads to brittle cracks, which can result in catastrophic failure of electronic components, assemblies and spacecraft payloads. As industrial processes begin to move away from Pb-Sn solder, it is even more critical to characterize the behavior of alternative Sn-based solders. Here we report on initial investigations using a modified Charpy test apparatus to characterize the ductile to brittle transformation temperature of nine different solder systems.
Keywords :
assembling; brittleness; cryogenic electronics; ductility; lead alloys; solders; tin alloys; Charpy test apparatus; aerospace applications; assembly; brittle cracks; catastrophic failure; cryogenic applications; ductile to brittle transformation temperature; ductile to brittle transition; electronic components; extreme temperature conditions; industrial processes; low temperatures tin-based solders; mechanical performance; microelectronics; solder alloy ductility; solder systems; spacecraft payloads; Abstracts; Antenna accessories; Batteries; Metals; Nitrogen; Reliability;
Conference_Titel :
Advanced Packaging Materials (APM), 2013 IEEE International Symposium on
Conference_Location :
Irvine, CA
Print_ISBN :
978-1-4673-6093-7
Electronic_ISBN :
1550-5723
DOI :
10.1109/ISAPM.2013.6510390