Title :
A novel stacking method of filling hole used in package on package
Author :
Ling-Feng Shi ; Zheng Wei ; Xin-Quan Lai ; Qin-Qin Li ; Chen Liu
Author_Institution :
Inst. of Electron. CAD, Xidian Univ., Xi´an, China
fDate :
Feb. 27 2013-March 1 2013
Abstract :
With the developing of the electronics industry, 3-D package stack has been a new trend. Currently, most of the package on package (POP) stack adopted the bump interconnection with the solder balls, resulted in some issues, such as bridging, shifting and warpage. In this paper, a novel stacking method is presented to solve the problems of interconnection and stacking accuracy mentioned above. The insulating medium was adhered to the substrate; a hole was drilled according to the interconnection requirement. Then the hole is filled with copper and interconnects the substrates through the insulating medium. Meanwhile, this lead-free soldering stacking method of filling hole adapt to the global green manufacturing trend.
Keywords :
electronics industry; electronics packaging; insulating coatings; interconnections; soldering; solders; stacking; 3D package stack; POP stack; bump interconnection; electronics industry; filling hole; global green manufacturing trend; insulating medium; lead-free soldering stacking method; package on package; solder balls; stacking accuracy; stacking method; Abstracts; Copper; Epoxy resins; Market research; Substrates; System-on-chip;
Conference_Titel :
Advanced Packaging Materials (APM), 2013 IEEE International Symposium on
Conference_Location :
Irvine, CA
Print_ISBN :
978-1-4673-6093-7
Electronic_ISBN :
1550-5723
DOI :
10.1109/ISAPM.2013.6510391