Title :
An Extended Four-Port Noise Matching Network
Author :
Takeda, S. ; Uchino, A.
Author_Institution :
Kyocera Corporation, Tokyo Central Research Lab., Tamagawadal 2-chome Setagaya-ku, Tokyo 158, Japan
Abstract :
An extended four-port noise matching network is proposed. The use of this four-port noise matching network allows further improvement in the minimal noise figure of linear noisy two-ports by conventional two-port matching networks.
Keywords :
Acoustic reflection; Gain; Impedance matching; Noise figure; Optimization methods; Optimized production technology; Scattering parameters; State feedback;
Conference_Titel :
Microwave Conference, 1991. 21st European
Conference_Location :
Stuttgart, Germany
DOI :
10.1109/EUMA.1991.336554
