Title :
Design yield and reliability issues in mass producible MMICs
Author :
Bastida, E.M. ; Donzelli, G.P. ; Magistrali, F. ; Pagani, M.
Author_Institution :
Alcatel-Telettro, Via Trento 30, 20059 Vimercate (MI) Italy. Fax +39-39-6080891. Phone +39-39-6864257.
Abstract :
On the basis of a specific development procedure a review and a critical analysis are made of the state of the art criteria and tools for MMIC design and for evaluation of their yield and reliability. The information usually available from foundries are also critically reviewed. Finally, specific research fields are pointed out where more urgent is the need of enhanced theoretical and experimental tools.
Keywords :
Circuit testing; Equivalent circuits; Fabrication; Failure analysis; Fitting; Foundries; MMICs; Microwave measurements; Prototypes; Shape measurement;
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
DOI :
10.1109/EUMA.1993.336761
