DocumentCode
2087598
Title
Design yield and reliability issues in mass producible MMICs
Author
Bastida, E.M. ; Donzelli, G.P. ; Magistrali, F. ; Pagani, M.
Author_Institution
Alcatel-Telettro, Via Trento 30, 20059 Vimercate (MI) Italy. Fax +39-39-6080891. Phone +39-39-6864257.
fYear
1993
fDate
6-10 Sept. 1993
Firstpage
19
Lastpage
25
Abstract
On the basis of a specific development procedure a review and a critical analysis are made of the state of the art criteria and tools for MMIC design and for evaluation of their yield and reliability. The information usually available from foundries are also critically reviewed. Finally, specific research fields are pointed out where more urgent is the need of enhanced theoretical and experimental tools.
Keywords
Circuit testing; Equivalent circuits; Fabrication; Failure analysis; Fitting; Foundries; MMICs; Microwave measurements; Prototypes; Shape measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1993. 23rd European
Conference_Location
Madrid, Spain
Type
conf
DOI
10.1109/EUMA.1993.336761
Filename
4136519
Link To Document