Statistical circuit simulation and yield analysis for IC´s

The importance of running statistically based process, device and circuit simulations is becoming critical to IC design for manufacturing techniques. Thus arises the need for software-based packages that couple statistical techniques to conventional simulators. Monte Carlo techniques have been implemented in various such packages, but the nature of Monte Carlo designs often lead to time-consuming and inefficient techniques. This paper concentrates on coupling more efficient statistical techniques (based on a Design of Experiments methodology) and conventional simulators with the aid of software tools for the purpose of characterizing circuit performances in terms of equipment and material variables