Title :
Testing Conformance of Life Cycle Dependent Properties of Mobile Applications
Author :
Franke, Dominik ; Kowalewski, Stefan ; Weise, Carsten ; Prakobkosol, Nath
Author_Institution :
Embedded Software Lab., Aachen, Germany
Abstract :
Operating systems of modern mobile devices, like e.g. iOS and Android, require the applications to conform to a life cycle model, to ensure the functional correctness of the application and its data integrity over exceptional behavior as e.g. out-swapping of the application. The applications life cycle events are triggered asynchronously by the system and depend on the environment. In order to test life cycle dependent properties of the applications, we define a unit testing based approach that uses life cycle callback-methods. The method identifies life cycle dependent properties in the application specification, and derives assertion-based test cases for validating the conformance of the properties. Life cycle triggers are used in the test case execution. The paper describes to which application features the approach can be applied, and the limitations of the approach. A case study demonstrates how to apply our approach to state-of-the-art mobile platforms, using Android 2.2 as an example.
Keywords :
conformance testing; data integrity; formal specification; mobile computing; operating systems (computers); program testing; Android 2.2; application specification; assertion-based test case; conformance testing; conformance validation; data integrity; functional correctness; iOS; life cycle callback-method; life cycle dependent properties; life cycle event; life cycle model; mobile application; mobile device; mobile platform; operating system; test case execution; unit testing; Androids; Humanoid robots; Java; Mobile communication; Operating systems; Random access memory; Testing; Android; Android Activity; application life cycle; conformance testing; mobile; process life cycle; testing; unit test;
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2012 IEEE Fifth International Conference on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4577-1906-6
DOI :
10.1109/ICST.2012.104