DocumentCode
2087887
Title
Building true logic LNVM with automotive-level reliability
Author
Horch, Andrew ; Wang, Bin ; Niset, Martin ; Hu, TJ ; Gilliland, Troy ; Humes, Todd
Author_Institution
Embedded NVM Group, Virage Logic Inc., Seattle, WA, USA
fYear
2008
fDate
11-14 Nov. 2008
Firstpage
1
Lastpage
5
Abstract
Logic NVM (LNVM) developed in baseline logic processes is gaining more interest from automotive applications. We discuss for the first time how to build such LNVM to achieve and assure automotive-level quality through the product development cycle. We successfully demonstrate that in-field reliability < 1 ppm may be achieved with appropriate layout and architecture selections.
Keywords
automobile industry; digital storage; logic; product life cycle management; reliability; LNVM; automotive-level reliability; baseline logic processes; in-field reliability; logic nonvolatile memory solutions; product development cycle; Automotive applications; Automotive engineering; Costs; Design for manufacture; Logic; Nonvolatile memory; Phase change materials; Product development; Production; Testing; Logic NVM; automotive; floating-gate; qualification; reliability modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Non-Volatile Memory Technology Symposium, 2008. NVMTS 2008. 9th Annual
Conference_Location
Pacific Grove, CA
Print_ISBN
978-1-4244-3659-0
Electronic_ISBN
978-1-4244-2411-5
Type
conf
DOI
10.1109/NVMT.2008.4731197
Filename
4731197
Link To Document