Title :
CARIAL: Cost-Aware Software Reliability Improvement with Active Learning
Author :
Sun, Boya ; Shu, Gang ; Podgurski, Andy ; Ray, Soumya
Abstract :
In the context of field testing (operational testing) of software, we address the problem of balancing the potential reduction in failure risk that developers may achieve by reviewing captured test executions to identify failures (and by successfully debugging their causes) against the cost of reviewing the tests. To achieve a desirable balance, we propose a cost-sensitive active learning strategy. Our approach guides developers in selecting a sample of test executions to review and label, and it calls for them to profile execution dynamics and characterize the symptoms and relative severity levels of failures. Profiles, labels, failure symptoms, and severity levels are used by the active learner to construct and refine a mapping between examined and unexamined tests, on one hand, and possible defects, on the other hand. This mapping is used together with estimates of test review costs to guide the selection of additional tests. We evaluate our approach on three subject programs and show that it (1) produces reasonable predictions of risk reduction and (2) significantly improves severity-weighted reliability for each subject program, with relatively low developer effort.
Keywords :
failure analysis; learning (artificial intelligence); program testing; software cost estimation; software fault tolerance; cost aware software reliability improvement; cost sensitive active learning strategy; failure identification; failure risk; profile execution dynamics; risk reduction; severity weighted reliability; software testing; test execution; test review cost estimation; Clustering algorithms; Debugging; Partitioning algorithms; Software; Software reliability; Testing; Operational testing; active learning; cost-sensitive analysis; delivered reliability; reliability improvement; risk reduction;
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2012 IEEE Fifth International Conference on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4577-1906-6
DOI :
10.1109/ICST.2012.116