DocumentCode :
2088369
Title :
Equivalence of physical optics and aperture field integration method in the full pattern analysis-effects of integration surface
Author :
Oodo, M. ; Ando, M.
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
Volume :
2
fYear :
1995
fDate :
18-23 June 1995
Firstpage :
889
Abstract :
The integration surface and the equivalent currents in aperture field integration method (AFIM) are numerically discussed in view of the equivalence of physical optics (PO) and AFIM. It was shown that provided we account for the lateral surface besides the projected aperture and we use the equivalent currents consisting of both the incident and geometrical optics (GO) reflected fields, PO and AFIM predict the equivalent-patterns in all the angular region. The roles of the incident and GO reflected fields in the definition of the equivalent currents are extracted.
Keywords :
antenna radiation patterns; electric current; electromagnetic fields; physical optics; reflector antennas; PO; angular region; aperture field integration method; equivalent currents; equivalent-patterns; full pattern analysis; incident fields; integration surface; lateral surface; physical optics; projected aperture; reflected fields; Apertures; Erbium; Frequency conversion; Integrated optics; Magnetic fields; Optical frequency conversion; Optical surface waves; Pattern analysis; Physical optics; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location :
Newport Beach, CA, USA
Print_ISBN :
0-7803-2719-5
Type :
conf
DOI :
10.1109/APS.1995.530160
Filename :
530160
Link To Document :
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