DocumentCode :
2088496
Title :
A New Method of Generating Excited Signal and its Application in the Piezomagnetic Type Shape Meter
Author :
Li Zhiming ; Peng Yan ; Yu Bingqiang ; Liu Hongmin ; Yang Lipo
Author_Institution :
Yanshan Univ., Qinhuangdao, China
Volume :
4
fYear :
2010
fDate :
14-15 Aug. 2010
Firstpage :
145
Lastpage :
148
Abstract :
The function of excited signal, in the generation, transmission and extraction process of measuring signal in the piezomagnetic type shape meter, was particularly analyzed, and its importance of signal quality to measuring accuracy of stripe shape was showed clearly. Aimming to the various disadvantages of traditional methodes on generating excited signal, a new method based on microcontroller was proposed. Following the method given, a exciting power system for the shape meter appling to the 1250 HC cold rolling mill of ANSHAN IRON AND STEEL GROUP CORPORATION was developmented. Industrial operation shows this exciting power system can provide the current-collecting device of shape meter and signal processing system with high-quality excited signals. The distortion degree of measuring signal is greatly reduced in the process of transmission and extraction, sequentially, the measuring accuracy of stripe shape is significantly improved. This method offers a new way for exciting circuit design, and has much reference to produt design relating to excited signal.
Keywords :
distortion; exciters; microcontrollers; piezoelectric transducers; rolling mills; shape measurement; signal generators; cold rolling mill; current-collecting device; excited signal; microcontroller; piezomagnetic type shape meter; power system excitation; signal distortion; signal extraction process; signal generation; signal processing system; signal transmission; Frequency measurement; Microcontrollers; Power systems; Pressure measurement; Shape; Shape measurement; Steel; excited signal; exciting circuit; microcontroller; piezomagnetic sensor; shape meter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Engineering (ICIE), 2010 WASE International Conference on
Conference_Location :
Beidaihe, Hebei
Print_ISBN :
978-1-4244-7506-3
Electronic_ISBN :
978-1-4244-7507-0
Type :
conf
DOI :
10.1109/ICIE.2010.325
Filename :
5572707
Link To Document :
بازگشت