Title :
A reliability function in the three dimensional parametric space and the study of digital systems
Author :
Prasad, Vinod B.
Author_Institution :
Dept. of Electr. & Comput. Eng. Technol., Bradley Univ., Peoria, IL, USA
Abstract :
The reliability of various digital systems are discussed, and an equation for the reliability function is obtained using Markov model with three parameters
Keywords :
Markov processes; digital systems; graph theory; reliability; Markov model; digital systems; reliability function; three dimensional parametric space; Digital systems; Environmental economics; Equations; Fault tolerance; Fault tolerant systems; Reliability engineering; Routing; Signal design; Space technology; Tree graphs;
Conference_Titel :
Southeastcon '94. Creative Technology Transfer - A Global Affair., Proceedings of the 1994 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
0-7803-1797-1
DOI :
10.1109/SECON.1994.324309
