Title :
Identifying relatively high-risk group of coronary artery calcification based on progression rate: Statistical and machine learning methods
Author :
Ha-Young Kim ; Sanghyun Yoo ; Jihyun Lee ; Hye Jin Kam ; Kyoung-Gu Woo ; Yoon-Ho Choi ; Jidong Sung ; Mira Kang
Author_Institution :
Samsung Adv. Inst. of Technol., Yongin, South Korea
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
Coronary artery calcification (CAC) score is an important predictor of coronary artery disease (CAD), which is the primary cause of death in advanced countries. Early prediction of high-risk of CAC based on progression rate enables people to prevent CAD from developing into severe symptoms and diseases. In this study, we developed various classifiers to identify patients in high risk of CAC using statistical and machine learning methods, and compared them with performance accuracy. For statistical approaches, linear regression based classifier and logistic regression model were developed. For machine learning approaches, we suggested three kinds of ensemble-based classifiers (best, top-k, and voting method) to deal with imbalanced distribution of our data set. Ensemble voting method outperformed all other methods including regression methods as AUC was 0.781.
Keywords :
blood vessels; cardiovascular system; diseases; learning (artificial intelligence); patient diagnosis; regression analysis; CAC score; coronary artery calcification; coronary artery disease; death; ensemble voting method; linear regression based classifier; logistic regression model; machine learning method; performance accuracy; progression rate; relatively high risk group identification; statistical method; symptom; Accuracy; Arteries; Calcium; Design automation; Diseases; Logistics; Solid modeling; Algorithms; Artificial Intelligence; Calcinosis; Coronary Artery Disease; Diagnosis, Computer-Assisted; Female; Humans; Male; Middle Aged; Pattern Recognition, Automated; Risk Assessment;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6346399