Title :
Enabling innovation in test manufacturing through ATE software standards
Author :
Nageswaran, Rohan ; Nelson, Chris
Author_Institution :
Intel Corp., Chandler, AZ
Abstract :
Business influential Michael Porter theorized that standards based solutions are more cost-effective and efficient than proprietary alternatives when there is little "differentiating value" seen by the end user. Intel\´s aggressive adoption of 300 mm standards in wafer manufacturing and automated test equipment (ATE) automation standards in test manufacturing validates this premise. These standards have provided rapid, cost-effective factory integration and have enabled greater investment in manufacturing innovation. There are similar opportunities for ATE operating system (OS) software standards. This paper elaborates on the history and successes of ATE automation standards at Intel and future directions for ATE OS software standards in the industry
Keywords :
automatic test equipment; innovation management; integrated circuit manufacture; operating systems (computers); production engineering computing; software standards; testing; 300 mm standards; Intel; automated test equipment automation standards; automated test equipment software standards; cost-effective factory integration; manufacturing innovation; operating system software standards; standards based solutions; test manufacturing; wafer manufacturing; Automatic testing; History; Investments; Manufacturing automation; Operating systems; Production facilities; Software standards; Software testing; Technological innovation; Test equipment;
Conference_Titel :
Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9143-8
DOI :
10.1109/ISSM.2005.1513294
