DocumentCode
2089521
Title
Innovative design-for-test techniques in a dynamic development environment
Author
Bou-Ghazale, Silvio
Author_Institution
IBM Corp., Boca Raton, FL, USA
fYear
1994
fDate
10-13 Apr 1994
Firstpage
431
Lastpage
434
Abstract
The personal computer industry has experienced unprecedented market pressures in the last few years. These pressures helped reshape the processes by which products are architected, implemented, and manufactured to contain cost, maintain quality, and provide fast time-to-market. This paper presents the design-for-test techniques that are essential in such an environment
Keywords
DP industry; design for testability; integrated circuit manufacture; specification languages; cost containment; design-for-test techniques; dynamic development environment; market pressures; personal computer industry; product architecture; product implementation; product manufacture; quality; time-to-market; Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Costs; Design for testability; Manufacturing; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '94. Creative Technology Transfer - A Global Affair., Proceedings of the 1994 IEEE
Conference_Location
Miami, FL
Print_ISBN
0-7803-1797-1
Type
conf
DOI
10.1109/SECON.1994.324351
Filename
324351
Link To Document