DocumentCode :
2089938
Title :
A mathematical model to predict the optimal test line location and sample volume for lateral flow immunoassays
Author :
Ragavendar, M.S. ; Anmol, C.M.
Author_Institution :
Siemens Corp. Res. & Technol., Bangalore, India
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
2408
Lastpage :
2411
Abstract :
Lateral flow immunoassay (LFIA) platform is one of the most relevant technologies for screening and diagnosing clinical conditions [1]. However due to low sensitivity and poor repeatability of the platform it has been used only for limited and non-critical tests [2] [5]. Mathematical models have been used to understand the principles of capillary flow and antibody antigen based immuno reactions in nitrocellulose membrane typically seen in LFIA [4]. The model presented in this paper predicts the optimized location of test line on LFIA strip, sample volume and total reaction time that is needed to achieve the required sensitivity for different analytes on a case to case basis. The membrane properties like capillary flow time (s/cm), concentration and affinity constants of antibodies can be varied and the corresponding effect on strip design can be found. Hence this model can be used as a design tool to optimize the LFIA strip construction and reagent development processes.
Keywords :
biological techniques; biomembrane transport; capillarity; microfluidics; LFIA platform; antibody antigen based immuno reaction; capillary flow; lateral flow immunoassay; nitrocellulose membrane; optimal test line location; repeatability; sample volume; sensitivity; total reaction time; Equations; Immune system; Mathematical model; Optimized production technology; Sensitivity; Strips; Capillary Action; Computer Simulation; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Immunoassay; Membranes, Artificial; Models, Theoretical; Reagent Strips; Rheology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6346449
Filename :
6346449
Link To Document :
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