Title :
Boundary element method macromodels for 2-D hierarchical capacitance extraction
Author :
Dengi, E. Aykut ; Rohrer, Ronald A.
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
A 2-D hierarchical field solution method was recently introduced for capacitance extraction for VLSI interconnect modeling. In this paper, we present several extensions to the method including a Boundary Element Method (BEM) formulation for creating macromodels, which provides a better trade-off between accuracy and efficiency, as well as parameterized elements, which allow the analysis of gridless designs with reasonable accuracy and a small library size.
Keywords :
VLSI; boundary-elements methods; circuit analysis computing; integrated circuit interconnections; Boundary Element Method; VLSI interconnect modeling; capacitance extraction; gridless designs; macromodels; Boundary element methods; Capacitance; Conductors; Finite difference methods; Integrated circuit interconnections; Integrated circuit yield; Libraries; Permission; Runtime; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1998. Proceedings
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-964-5
