Title :
A Low Power, High Performance Threshold Logic-Based Standard Cell Multiplier in 65 nm CMOS
Author :
Leshner, Samuel ; Berezowski, Krzysztof ; Yao, Xiaoyin ; Chalivendra, Gayathri ; Patel, Saurabh ; Vrudhula, Sarma
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
Abstract :
In this paper we describe the design, simulation, fabrication, and test of a 32-bit 2´s complement integer multiplier constructed from a combination of CMOS standard cells and threshold logic elements in a 65 nm low power process. As compared to a multiplier designed solely using CMOS standard cells, the threshold logic based multiplier is 1.23x smaller and consumes 1.41x less dynamic power and 2.5x less leakage power at the same process corner.
Keywords :
CMOS logic circuits; logic design; logic testing; multiplying circuits; threshold logic; CMOS standard cells; threshold logic-based standard cell multiplier; CMOS integrated circuits; Clocks; Delay; Logic gates; Power demand; Radiation detectors; Testing; high performance; low leakage; low power; multiplier; standard cell; threshold logic;
Conference_Titel :
VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on
Conference_Location :
Lixouri, Kefalonia
Print_ISBN :
978-1-4244-7321-2
DOI :
10.1109/ISVLSI.2010.32