DocumentCode
2090320
Title
Multifractal Analysis of Epilepsy in Electroencephalogram
Author
He, Aijun ; Yang, Xiaodong ; Yang, Xi ; Ning, Xinbao
Author_Institution
Nanjing Univ., Nanjing
fYear
2007
fDate
23-27 May 2007
Firstpage
1417
Lastpage
1420
Abstract
The Electroencephalogram (EEG) is a representative signal containing information about the condition of the brain. It is highly subjective, and the symptoms may appear at random in the time scale. Traditional methods for nonlinear dynamic analysis, such as correlation dimension, Lyapunov exponent, approximate entropy, detrended fluctuation analysis, using a single parameter, cannot fully describe the extremely sophisticated behavior of EEG. The multifractal formulism reveals more "hidden" information of EEG by using singularity spectrum to characterize its nonlinear dynamics. In this paper, we explored the ability of multifractal to discriminate the EEG signals recorded from healthy volunteers with eyes open, epilepsy patients in the epileptogenic zone during a seizure-free interval, and epilepsy patients during epileptic seizures. The multifractal singularity spectrum of EEG signals from every group is calculated and the mean and standard variation of the range of the singularity strength, Deltaalpha , are compared. The obtained results demonstrated that the proposed method can be useful in analyzing long-term EEG signals for early detection of the electroencephalographic changes.
Keywords
electroencephalography; medical signal processing; neurophysiology; patient diagnosis; Lyapunov exponent; approximate entropy; brain; correlation dimension; detrended fluctuation analysis; electroencephalogram; epilepsy; epileptic seizures; long-term EEG signals; multifractal analysis; multifractal singularity spectrum; nonlinear dynamic analysis; seizure-free interval; Biomedical measurements; Chaos; Electroencephalography; Entropy; Epilepsy; Fluctuations; Fractals; Neurons; Recurrent neural networks; Signal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Complex Medical Engineering, 2007. CME 2007. IEEE/ICME International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-1077-4
Electronic_ISBN
978-1-4244-1078-1
Type
conf
DOI
10.1109/ICCME.2007.4381978
Filename
4381978
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