DocumentCode :
2090429
Title :
FGMOS Based Built-In Current Sensor for Low Supply Voltage Analog and Mixed-Signal Circuits Testing
Author :
Siskos, S.
Author_Institution :
Phys. Dept., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
fYear :
2010
fDate :
5-7 July 2010
Firstpage :
259
Lastpage :
264
Abstract :
A simple current mirror using floating-gate MOS transistors (FGMOS) operating in the linear region is used in this work, to design a built-in current sensor (BICS). The important feature in this application is that the voltage drop across the sensing device can be reduced to almost zero value (less than 50 mV). This makes the proposed BICS appropriate for modern very low supply voltage applications. The proposed BICS in conjunction with an RMS-to-DC converter and a novel current window comparator can be used to efficiently achieve supply current monitoring of analog and mixed-signal circuit testing.
Keywords :
MOSFET circuits; analogue circuits; built-in self test; circuit testing; current mirrors; electric current measurement; mixed analogue-digital integrated circuits; FGMOS based built-in current sensor; current mirror; current monitoring; floating gate MOS transistors; low supply voltage analog circuit testing; mixed-signal circuits testing; Capacitance; Converters; Mirrors; Monitoring; Testing; Threshold voltage; Transistors; Built-in current sensor; analog and mixed signal testing; floating-gate MOS transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on
Conference_Location :
Lixouri, Kefalonia
Print_ISBN :
978-1-4244-7321-2
Type :
conf
DOI :
10.1109/ISVLSI.2010.31
Filename :
5572782
Link To Document :
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