• DocumentCode
    2090636
  • Title

    Reliability-Aware Dynamic Voltage and Frequency Scaling

  • Author

    Firouzi, F. ; Salehi, M.E. ; Wang, F. ; Fakhraie, S.M. ; Safari, S.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
  • fYear
    2010
  • fDate
    5-7 July 2010
  • Firstpage
    304
  • Lastpage
    309
  • Abstract
    Dynamic voltage and frequency scaling (DVFS) is an effective method for controlling energy dissipation of embedded systems. However, recent researches have illustrated that DVFS techniques have compromising effects on the system reliability. Our analysis results show that, ignoring the effects of voltage scaling on fault rate could considerably decrease the system reliability. Therefore, we use the slack time to increase system reliability as well as to save energy by frequency and voltage scaling techniques. We first investigate the effects of frequency and voltage scaling on the system reliability exploiting the proposed formula and then propose a reliability-aware DVFS scheme in which the frequency and voltage are scaled considering reliability and performance constraints. Comparing the results to that of the traditional DVFS methods the proposed reliability-aware DVFS yields 50% better power saving for the same reliably level.
  • Keywords
    embedded systems; power aware computing; reliability; embedded system; energy dissipation control; frequency scaling; reliability-aware dynamic voltage scaling; system reliability; Circuit faults; Error analysis; Integrated circuit modeling; Integrated circuit reliability; Mathematical model; Monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Lixouri, Kefalonia
  • Print_ISBN
    978-1-4244-7321-2
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2010.54
  • Filename
    5572791