• DocumentCode
    2090675
  • Title

    TRB: Tag Replication Buffer for Enhancing the Reliability of the Cache Tag Array

  • Author

    Wang, Shuai ; Hu, Jie ; Ziavras, Sotirios G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
  • fYear
    2010
  • fDate
    5-7 July 2010
  • Firstpage
    310
  • Lastpage
    315
  • Abstract
    Protecting the on-chip cache memories against soft errors has become an increasing challenge in designing new generation reliable microprocessors. Previous efforts have mainly focused on improving the reliability of the cache data arrays. Due to its crucial importance to the correctness of cache accesses, the tag array demands high reliability against soft errors while the data array is fully protected. Exploiting the address locality of memory accesses, we propose to duplicate most recently accessed tag entries in a small Tag Replication Buffer (TRB) thus to protect the information integrity of the tag array in the data cache with low performance, energy and area overheads. A Selective-TRB scheme is further proposed to protect only tag entries of dirty cache lines. The experimental results show that the Selective-TRB scheme achieves a higher access-with-replica (AWR) rate of 97.4% for the dirty-cache line tags. To provide a comprehensive evaluation of the tag-array reliability, we also conduct an architectural vulnerability factor (AVF) analysis for the tag array and propose a refined metric, detected-without-replica-AVF (DOR-AVF), which combines the AVF and AWR analysis. Based on our DOR-AVF analysis, a TRB scheme with early write-back (EWB) is proposed, which achieves a zero DOR-AVF at a negligible performance overhead.
  • Keywords
    cache storage; integrated circuit reliability; microprocessor chips; AWR analysis; AWR rate; DOR-AVF analysis; access-with-replica rate; address locality; architectural vulnerability factor; cache data array; cache line; cache tag array; data cache; detected-without-replica-AVF; early write-back; information integrity; memory access; new generation reliable microprocessor; on-chip cache memory; selective-TRB scheme; soft error; tag replication buffer; tag-array reliability; Arrays; Encoding; Microprocessors; Registers; Reliability engineering; System-on-a-chip; Cache; Reliability; Soft Error; Tag Replication Buffer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Lixouri, Kefalonia
  • Print_ISBN
    978-1-4244-7321-2
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2010.25
  • Filename
    5572792