DocumentCode
2090675
Title
TRB: Tag Replication Buffer for Enhancing the Reliability of the Cache Tag Array
Author
Wang, Shuai ; Hu, Jie ; Ziavras, Sotirios G.
Author_Institution
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
fYear
2010
fDate
5-7 July 2010
Firstpage
310
Lastpage
315
Abstract
Protecting the on-chip cache memories against soft errors has become an increasing challenge in designing new generation reliable microprocessors. Previous efforts have mainly focused on improving the reliability of the cache data arrays. Due to its crucial importance to the correctness of cache accesses, the tag array demands high reliability against soft errors while the data array is fully protected. Exploiting the address locality of memory accesses, we propose to duplicate most recently accessed tag entries in a small Tag Replication Buffer (TRB) thus to protect the information integrity of the tag array in the data cache with low performance, energy and area overheads. A Selective-TRB scheme is further proposed to protect only tag entries of dirty cache lines. The experimental results show that the Selective-TRB scheme achieves a higher access-with-replica (AWR) rate of 97.4% for the dirty-cache line tags. To provide a comprehensive evaluation of the tag-array reliability, we also conduct an architectural vulnerability factor (AVF) analysis for the tag array and propose a refined metric, detected-without-replica-AVF (DOR-AVF), which combines the AVF and AWR analysis. Based on our DOR-AVF analysis, a TRB scheme with early write-back (EWB) is proposed, which achieves a zero DOR-AVF at a negligible performance overhead.
Keywords
cache storage; integrated circuit reliability; microprocessor chips; AWR analysis; AWR rate; DOR-AVF analysis; access-with-replica rate; address locality; architectural vulnerability factor; cache data array; cache line; cache tag array; data cache; detected-without-replica-AVF; early write-back; information integrity; memory access; new generation reliable microprocessor; on-chip cache memory; selective-TRB scheme; soft error; tag replication buffer; tag-array reliability; Arrays; Encoding; Microprocessors; Registers; Reliability engineering; System-on-a-chip; Cache; Reliability; Soft Error; Tag Replication Buffer;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on
Conference_Location
Lixouri, Kefalonia
Print_ISBN
978-1-4244-7321-2
Type
conf
DOI
10.1109/ISVLSI.2010.25
Filename
5572792
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