Modelling behaviour and tolerances in analogue cells

The authors describe an efficient method for obtaining the parameters of behavioural models of analogue cells from either measurements of fabricated devices or from circuit simulation. No assumption about the analytical mapping between the performance space and the behavioural parameter space is required. By combining this method with standard tolerance analysis techniques based on the Monte Carlo method one can include tolerance information in the behavioural model. Such models can be used for simulation and yield estimation at the system level. The method is demonstrated on the behaviour model of a switched capacitor integrator by considering the effect of tolerance derived from both simulations and measurements