A hysteresis model for vanadium oxide thermal radiation sensor

Author

De Almeida, Luiz Alberto L ; Deep, Gurdip S. ; Lima, Antôinio Marcus N ; Neff, Helmut ; Freire, Raimundo S.

Author_Institution

Dept. de Engenharia Eletrica, Univ. Fed. da Bahia, Salvador, Brazil

Volume

3

fYear

2000

fDate

2000

Firstpage

1214

Abstract

This paper presents the adaptation of Preisach model, originally developed for magnetic hysteresis, to describe the hysteresis in the resistance-temperature characteristics of vanadium oxide (VO₂) thin film radiation sensor. The necessary and sufficient conditions for the applicability of the Preisach model to VO ₂ film sensor are experimentally verified. Experimentally measured characteristics are compared with those given by the model for minor and major loops

Keywords

electric sensing devices; heat radiation; magnetic hysteresis; radiometry; thin film devices; vanadium compounds; Preisach model; VO₂; VO₂ film sensor; hysteresis model; magnetic hysteresis; major loops; minor loops; radiation sensor; resistance-temperature characteristics; thermal radiation sensor; vanadium oxide; Bolometers; Magnetic films; Magnetic hysteresis; Mathematical model; Metal-insulator structures; Semiconductor films; Sensor phenomena and characterization; Temperature sensors; Thermal sensors; Thin film sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE

Conference_Location

Baltimore, MD

ISSN

1091-5281

Print_ISBN

0-7803-5890-2

Type

conf

DOI

10.1109/IMTC.2000.848671

Filename

848671