Title :
Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging
Author :
Giakos, G.C. ; Guntupalli, R. ; Odogba, J. ; Shah, N. ; Vedantham, S. ; Suryanarayanan, S. ; Chowdhury, S. ; Passerini, A.G. ; Nemer, R. ; Mehta, K. ; Sumrain, S. ; Patnekar, N. ; Sridhar, M. ; Russo, Fabrizio
Author_Institution :
Olson Res. Center, Akron Univ., OH, USA
Abstract :
The rising and falling edges of detected signal pulses have been measured utilizing X-ray ionization of a planar Cd1-xZnx Te system under different irradiation geometries. The experimental results of this study indicate that the time response of the CdZnTe based X-ray system is suitable for digital pulsed radiographic applications
Keywords :
II-VI semiconductors; X-ray imaging; cadmium compounds; diagnostic radiography; image sensors; ionisation; Cd1-xZnxTe planar system; CdZnTe; II-IV direct type semiconductor detectors; X-ray ionization; digital pulsed radiographic applications; flat-panel pulsed X-ray imaging; irradiation geometries; pulse timing optimization; Geometry; Ionization; Pulse measurements; Signal detection; Tellurium; Time factors; Timing; X-ray detection; X-ray detectors; Zinc;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848677
