Title :
Modeling in the presence of switching uncertainties
Author :
Van Moer, Wendy ; Rolain, Yves ; Pintelon, Rik
Author_Institution :
Vrije Univ., Brussels, Belgium
Abstract :
This paper presents a method that takes into account the switching uncertainties in the signal path of the measurement devices during the identification of device models. Switching phenomena in the measurement instrument, like switching attenuators, induce jumps in the measured input-output characteristic that can be much larger than the noise contributions. The proposed method eliminates the subsequent model error by considering these jumps as a signal path state dependent stochastic contribution
Keywords :
Bayes methods; estimation theory; identification; random noise; signal processing; stochastic processes; switching transients; identification; input-output characteristic; model error; noise contributions; signal path; stochastic contribution; switching attenuators; switching phenomena; switching uncertainties; Additive noise; Attenuation measurement; Attenuators; Covariance matrix; Instruments; Jacobian matrices; Maximum likelihood estimation; Noise measurement; Stochastic resonance; Uncertainty;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848679
