DocumentCode :
2091405
Title :
Compensation of surface inclination for detecting in optical triangulation sensors
Author :
Kim, Kyung-Chan ; Oh, Se-Baek ; Kim, Jong-Ahn ; Kim, Soohyun ; Kwak, Yoon Keun
Author_Institution :
Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1292
Abstract :
Optical Triangulation Displacement Sensors (OTDSs) are widely used for their simple structure, high resolution, and long operating range. However, errors originating from speckle, inclination of the object, source power fluctuation, ambient light, and noise of the detector limit their usability. In this paper, we propose new design criteria for an error-reduced OTDS. The light source module for the system consists of an incoherent light source and a multimode optical fiber for eliminating speckle and shaping a Gaussian beam intensity profile. A diffuse-reflective white copy paper, which is attached to the object, makes the light intensity distribution on the charge-coupled device (CCD). Since the peak position of the intensity distribution is not related to the various error sources, a sub-pixel resolution signal processing algorithm that can detect the peak position makes it possible to construct an error-reduced OTDS system
Keywords :
CCD image sensors; displacement measurement; error compensation; image processing; light sources; speckle; Gaussian beam intensity profile; charge-coupled device; diffuse-reflective white copy paper; error sources; error-reduced OTDS system; errors; intensity distribution; light intensity distribution; multimode optical fiber; optical triangulation sensors; peak position; signal processing algorithm; source power fluctuation; speckle; subpixel resolution; surface inclination; usability; Adaptive optics; Fluctuations; Light sources; Multi-stage noise shaping; Object detection; Optical detectors; Optical noise; Optical sensors; Optical signal processing; Speckle;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
ISSN :
1091-5281
Print_ISBN :
0-7803-5890-2
Type :
conf
DOI :
10.1109/IMTC.2000.848684
Filename :
848684
Link To Document :
بازگشت