• DocumentCode
    2091421
  • Title

    Multivariate fault detection (MVFD) EP/FDC implementation

  • Author

    Biton, Tal ; Ratner, Hagay

  • Author_Institution
    Intel Inc., Qiryat-Gat, Israel
  • fYear
    2005
  • fDate
    13-15 Sept. 2005
  • Firstpage
    377
  • Lastpage
    380
  • Abstract
    The increase in the complexity of interrelations between multiple process input variables has led to the rise of multivariate fault detection (MVFD) as the next generation statistical process control methodology. Two or more variables (e.g. flow, power, temperature, pressure...) may appear to be within standard population while their combination indicates a non standard condition within the multi-dimensional space, which leads to discrepant material. Eight dimensional MVFD applied to the "excursion prevention" (EP/FDC) tool parameters of a medium current implanter has been demonstrated at an Intel fab. This paper describes how multivariate statistics such as principal component analysis (PCA). Hotelling T2 SPC charts and contribution plots are being used to provide an on-line multivariate statistical control and excursion alert system. The system has detected problems that traditional univariate SPC systems could not detect.
  • Keywords
    control charts; fault diagnosis; integrated circuit manufacture; principal component analysis; statistical process control; Intel fab; contribution plots; discrepant material; excursion alert system; excursion prevention tool; medium current implanter; multivariate fault detection; online multivariate statistical control; principal component analysis; statistical process control chart; Control systems; Fault detection; Input variables; Predictive models; Principal component analysis; Process control; Statistical analysis; Statistical distributions; Statistics; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on
  • Print_ISBN
    0-7803-9143-8
  • Type

    conf

  • DOI
    10.1109/ISSM.2005.1513383
  • Filename
    1513383