• DocumentCode
    2091455
  • Title

    Flatness measurement system based on a non-linear optical triangulation technique

  • Author

    Garcia, Diego ; Garcia, M.A. ; Obeso, F.

  • Author_Institution
    Dept. of Comput. Sci., Oviedo Univ., Spain
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1297
  • Abstract
    This paper describes the development of a flatness measurement system, integrated in the control process of a hot strip mill in the steel industry. The objective of the system is to calculate flatness indexes for every rolled strip, comparing the length of its lateral profiles with the central length. The reconstruction of the profiles is based on a non-linear triangulation technique. Images of the steel strip, at high temperature and high speed, are sampled every two milliseconds at five different points and are processed on-line in order to calculate height displacement values of the strip, which allows the calculation of final flatness indexes for the steel strip. The measurement method developed,introduces an innovative geometry in the disposition of the optic elements which increases the measurement range of the system without reducing its precision. It also includes a tracking system to compensate for the effects of lateral displacements of the strip. The flatness measurement system has been implemented using a heterogeneous distributed computer system
  • Keywords
    computerised instrumentation; distributed processing; measurement by laser beam; optical tracking; steel industry; surface topography measurement; central length; distributed computer system; flatness indexes; flatness measurement; height displacement; hot strip mill; lateral displacements; lateral profiles; nonlinear optical triangulation; reconstruction; rolled strip; steel industry; steel strip; tracking system; Control systems; High speed optical techniques; Image reconstruction; Metals industry; Milling machines; Nonlinear optics; Process control; Steel; Strips; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.848685
  • Filename
    848685