• DocumentCode
    2091634
  • Title

    Improving the deployment of inspection tools; tutorial on inspection capacity and sample planning

  • Author

    Gudmundsson, Dadi ; Shanthikumar, J. George

  • Author_Institution
    Dept. of IEOR, California Univ., Berkeley, CA
  • fYear
    2005
  • fDate
    13-15 Sept. 2005
  • Firstpage
    410
  • Lastpage
    413
  • Abstract
    To help fabs improve their use of inspection tools a practical guide to inspection capacity and sample planning is presented. A comprehensive approach involving data collection, parameter estimation, and model based sample planning is covered. The objective is to enable yield engineers to develop basic inspection planning toolboxes in a spreadsheet and/or more effectively manage inspection planning projects. For parameter estimation, the use and performance of a hidden Markov model and the E-M algorithm is introduced
  • Keywords
    hidden Markov models; inspection; integrated circuit manufacture; parameter estimation; planning; sampling methods; data collection; hidden Markov model; inspection capacity; inspection planning projects; inspection planning toolboxes; parameter estimation; sample planning; yield engineers; Capacity planning; Costs; Engineering management; Hidden Markov models; Inspection; Metrology; Parameter estimation; Project management; Semiconductor device manufacture; Tutorial;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-9143-8
  • Type

    conf

  • DOI
    10.1109/ISSM.2005.1513391
  • Filename
    1513391