Title :
Proceedings of 1994 VLSI Technology Symposium [Front Cover]
Abstract :
Presents the front cover from the conference proceedings.
Keywords :
DRAM chips; SRAM chips; VLSI; circuit reliability; hot carriers; integrated circuit technology; integrated memory circuits; lithography; monolithic integrated circuits; semiconductor device models; BICMOS; CMOS fluctuations; DRAM capacitors; SOI technology; SRAM technologies; Si devices; VLSI reliability; bipolar technologies; deep submicron MOSFETS; deep submicron technology; dielectrics; hot carriers; interconnect technology; lithography; modelling; monolithic IC; nonvolatile memory; process technology; semiconductor ICs; silicides;
Conference_Titel :
VLSI Technology, 1994. Digest of Technical Papers. 1994 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-1921-4
DOI :
10.1109/VLSIT.1994.324445
