• DocumentCode
    2091945
  • Title

    A method of evaluating the temperature dependences of dielectric resonators and materials

  • Author

    Kobayashi, Yoshio ; Kogami, Yoshinori ; Katoh, Masayuki

  • Author_Institution
    Department of Electrical and Electronics Engineering, Saitama University, Shimo-Okubo 255, Urawa Saitama 338, Japan
  • fYear
    1993
  • fDate
    6-10 Sept. 1993
  • Firstpage
    562
  • Lastpage
    563
  • Abstract
    The intrinsic temperature coefficient of the resonant frequency TCf0, which is defined as the temperature coefficient of a resonant frequency when all the stored energy is confined inside a dielectric rod, is introduced to evaluate the temperature dependences of dielectric materials. The temperature coefficient of the resonant frequency TCf for a dielectric rod resonator can be estimated accurately from the TCf0 value. Actually, for shielded dielectric resonators of three types; parallel plate, image, and MIC types, it is shown that the TCf values can be estimated with the error of ±0.7 ppm/°C from the measured TCf0 value having the experimental error of ±0.5 ppm/°C
  • Keywords
    Dielectric materials; Dielectric measurements; Frequency estimation; Mechanical variables measurement; Microwave integrated circuits; Permittivity measurement; Resonant frequency; Stress measurement; Temperature dependence; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1993. 23rd European
  • Conference_Location
    Madrid, Spain
  • Type

    conf

  • DOI
    10.1109/EUMA.1993.336627
  • Filename
    4136688