DocumentCode :
2091996
Title :
Novel photo resist stripping for single wafer environmentally friendly process
Author :
Okuyama, Atsushi ; Asada, Kazumi ; Ishizaki, Itsuro ; Iwamoto, Hayato ; Hashizume, Akio
Author_Institution :
Sony Corp., Atsugi, Japan
fYear :
2005
fDate :
13-15 Sept. 2005
Firstpage :
453
Lastpage :
455
Abstract :
We have developed the resist stripping method having an extremely high stripping performance by single wafer process (SHARK Cleaning). In this study, we tried the improvement of the running cost that was the disadvantage of the SHARK cleaning. As a result, we drastically improved the chemical consumption maintaining the resist stripping performance by heating H2SO4 and optimizing the mixture ratio of the chemicals. Therefore, a cost reduction and environmentally friendly process with a high stripping performance were possible.
Keywords :
cleaning; cost reduction; environmental management; integrated circuit manufacture; photoresists; SHARK cleaning; cost reduction; mixture ratio; photo resist stripping; resist stripping method; single wafer environmentally friendly process; Chemicals; Costs; Green cleaning; Implants; Pollution measurement; Resists; Scanning probe microscopy; Strips; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on
Print_ISBN :
0-7803-9143-8
Type :
conf
DOI :
10.1109/ISSM.2005.1513403
Filename :
1513403
Link To Document :
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