DocumentCode
2092063
Title
Switch-level timing models in the MOS simulator BRASIL
Author
Warmers, H. ; Sass, D. ; Horneber, E.-H.
Author_Institution
Inst. fuer Netzwerktheorie und Schaltungstech., Tech. Univ. Braunschweig, Germany
fYear
1990
fDate
12-15 Mar 1990
Firstpage
568
Lastpage
572
Abstract
New timing models have been developed and implemented in the switch-level timing simulator BRASIL which are able to give fairly accurate signal waveforms. This enables the detection of faulty aspect ratios, dynamic hazards and races and timing faults caused by clock skew in NMOS and CMOS circuits. In contrast to most existing switch-level timing simulators the algorithm is not restricted to tree structures of the active subnetworks
Keywords
CMOS integrated circuits; circuit analysis computing; CMOS; NMOS; clock skew; dynamic hazards; faulty aspect ratios; races; signal waveforms; switch level timing models; timing faults; Circuit faults; Circuit simulation; Clocks; Electrical fault detection; Fault detection; Hazards; MOS devices; Semiconductor device modeling; Timing; Tree data structures;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1990., EDAC. Proceedings of the European
Conference_Location
Glasgow
Print_ISBN
0-8186-2024-2
Type
conf
DOI
10.1109/EDAC.1990.136711
Filename
136711
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