DocumentCode :
2092068
Title :
The effect of offset voltage on the kick-out pulses used in the nose-to-nose sampler impulse response characterization method
Author :
Larson, Donald R. ; Paulter, Nicholas G., Jr.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1425
Abstract :
The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The amplitude is almost linear for offset voltages from -500 mV to 500 mV except for values from about -50 mV to 50 mV. Slight changes in bandwidth were observed for offset voltages from -250 mV to 250 mV with significant bandwidth loss observed for offset voltages outside this range
Keywords :
calibration; digital instrumentation; oscilloscopes; signal sampling; transient response; -250 mV to 250 mV; -250 to 250 mV; -50 mV to 50 mV; -500 to 500 mV; amplitude; bandwidth; bandwidth loss; digital sampling oscilloscope; impulse response; kick-out pulses; nose-to-nose sampler; offset voltage; Bandwidth; Character generation; Electric variables measurement; Oscilloscopes; Photoconductivity; Pulse generation; Pulse measurements; Sampling methods; Time domain analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
ISSN :
1091-5281
Print_ISBN :
0-7803-5890-2
Type :
conf
DOI :
10.1109/IMTC.2000.848710
Filename :
848710
Link To Document :
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