• DocumentCode
    2092216
  • Title

    Sensor placement strategy for in-situ bearing defect detection

  • Author

    Wang, Changting ; Gao, Robert X.

  • Author_Institution
    Dept. of Mech. & Ind. Eng., Massachusetts Univ., Amherst, MA, USA
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1463
  • Abstract
    The placement of sensors is of critical importance to achieving high quality measurement for machine condition monitoring and fault diagnosis. This paper investigates sensor placement strategy for detecting structural defects of a ball bearing. Based on an analytical study of signal propagation from the defect location to the sensors, numerical simulations using a finite element algorithm were conducted to validate the signal strength at several representative sensor locations. The results were then experimentally verified through actual measurements. The study has shown that to achieve a high signal-to-noise ratio, the sensors need to be placed as closely as possible to the bearing, where signals due to structural defects are generated. The study has provided a theoretical framework for designing sensor-embedded bearings with built-in diagnostic capabilities
  • Keywords
    accelerometers; condition monitoring; electric sensing devices; fault diagnosis; finite element analysis; machine bearings; machine testing; maintenance engineering; vibration measurement; accelerometers; ball bearing; built-in diagnostic; damping factor; defect location; fault diagnosis; finite element algorithm; high quality measurement; high signal-to-noise ratio; impulse response; in-situ bearing defect detection; machine condition monitoring; numerical simulation; sensor placement strategy; sensor-embedded bearings; signal propagation; structural defects; vibration signal attenuation; Acoustic sensors; Attenuation; Background noise; Condition monitoring; Damping; Fault diagnosis; Mechanical sensors; Pollution measurement; Signal analysis; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.848717
  • Filename
    848717