• DocumentCode
    2092351
  • Title

    Measurement uncertainty estimation of a virtual instrument

  • Author

    Caldara, S. ; Nuccio, S. ; Spataro, C.

  • Author_Institution
    Dipt. di Ingegneria Elettrica, Palermo Univ., Italy
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1506
  • Abstract
    The law of uncertainty propagation is applied to a PC-based virtual instrument. According to the “guide to the expression of uncertainty in measurement”, the measuring model and the various sources of uncertainty have been taken into account. The expressions of the combined output uncertainty in various basic digital signal processing blocks, are obtained starting from each input sample absolute accuracy, without taking into account the parameters which regard the overall behavior of an acquisition board, such as the effective number of bits. In order to verify this procedure, the results obtained by means of the theoretical analysis, are compared with the ones obtained from numerical simulation. Then the results of experimental tests are presented to validate the proposed method. In particular, a virtual instrument, with a complex measurement chain for flicker evaluation, has been considered. The results are in a good agreement with the theoretical and numerical ones
  • Keywords
    ISO standards; measurement uncertainty; signal sampling; virtual instrumentation; ADC; DAQ; ISO guide; PC-based virtual instrument; basic DSP blocks; coherent sampling; combined output uncertainty; complex measurement chain; flicker evaluation; law of uncertainty propagation; measurement uncertainty estimation; measuring model; numerical simulation; sources of uncertainty; Data acquisition; Digital signal processing; Instruments; Measurement uncertainty; Numerical simulation; Particle measurements; Signal processing algorithms; Software measurement; Testing; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.848724
  • Filename
    848724