Title :
Development of a remotely accessible integrated circuit test facility based on telepresence
Author :
Chung, Edward C. ; Titus, Albert H.
Author_Institution :
Dept. of Electr. Eng., Rochester Inst. of Technol., NY, USA
Abstract :
This paper presents experiences learned from an ongoing research in employing telepresence technologies to facilitate an Internet-based remote IC (integrated circuits) testing laboratory at R.I.T. An instrumentation server has been developed using National Instrument´s Labview 5.0 to interface and control a number of GPIB-enabled lab instruments. By utilizing LabView´s Open Reference VI (virtual instruments) client/server model, an authorized user can remotely execute the VI graphical interface to manipulate various lab equipment via the Internet. The system is designed mainly for remote inspection and testing of packaged integrated circuits. Multi-platform accessibility is a key objective when designing the client module, which consists of the graphical VI interface. Any user with a computer (Windows, UNIX, or Macintosh) that is capable of Internet access, installed with a Java-enabled web browser, and has the ability to run Labview 5.0 will be able to access the networked lab equipment
Keywords :
Internet; automatic test equipment; automatic testing; client-server systems; integrated circuit testing; laboratory techniques; telemetry; virtual instrumentation; virtual reality; GPIB; Internet; Java-enabled web browser; LabView´s Open Reference VI; Macintosh; National Instrument´s Labview 5.0; R.I.T; UNIX; VI graphical interface; Windows; client/server model; graphical VI interface; instrumentation server; multi-platform accessibility; packaged integrated circuits; remote IC test; remote inspection; remote testing laboratory; telepresence; testing; virtual instruments; Circuit testing; Inspection; Instruments; Integrated circuit packaging; Integrated circuit technology; Integrated circuit testing; Internet; Packaging machines; System testing; Web server;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848739