DocumentCode
2092816
Title
Disease progression modeling using Hidden Markov Models
Author
Sukkar, R. ; Katz, Edward ; Yanwei Zhang ; Raunig, D. ; Wyman, B.T.
Author_Institution
Voxelon, Inc., Niles, IL, USA
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
2845
Lastpage
2848
Abstract
The development of novel treatments for many slowly progressing diseases, such as Alzheimer´s disease (AD), is dependent on the ability to monitor and detect changes in disease progression. In some diseases the distinct clinical stages of the disease progress far too slowly to enable a quick evaluation of the efficacy of a given proposed treatment. To help improve the assessment of disease progression, we propose using Hidden Markov Models (HMM´s) to model, in a more granular fashion, disease progression as compared to the clinical stages of the disease. Unlike many other applications of Hidden Markov Models, we train our HMM in an unsupervised way and then evaluate how effective the model is at uncovering underlying statistical patterns in disease progression by considering HMM states as disease stages. In this study, we focus on AD and show that our model, when evaluated on the cross validation data, can identify more granular disease stages than the three currently accepted clinical stages of “Normal”, “MCI” (Mild Cognitive Impairment), and “AD”.
Keywords
diseases; hidden Markov models; neurophysiology; physiological models; AD stage; Alzheimer disease; MCI stage; disease clinical stages; disease progression assessment; disease progression change detection; disease progression modeling; disease progression monitoring; hidden Markov models; mild cognitive impairment stage; normal stage; slowly progressing diseases; statistical patterns; Alzheimer´s disease; Biological system modeling; Biomarkers; Hidden Markov models; Testing; Training; Alzheimer Disease; Disease Progression; Humans; Markov Chains;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6346556
Filename
6346556
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