• DocumentCode
    2092855
  • Title

    Evaluation of parasitic coupling among coupled microstrip line discontinuities using a multiport network modeling approach

  • Author

    Sabban, Albert ; Gupta, K.C.

  • Author_Institution
    University of Colorado at Boulder, Boulder, CO 80309-0425, USA; Rafael, P.O.B. 2250 Haifa, Israel
  • fYear
    1993
  • fDate
    6-10 Sept. 1993
  • Firstpage
    656
  • Lastpage
    658
  • Abstract
    This paper presents a convenient method for evaluating parasitic coupling caused by coupled microstrip line discontinuities. A Multiport Network Model and a Planar Lumped Model are used to evaluate voltage distributions around the discontinuity edges and along the coupled line section. This voltage distribution is expressed as an equivalent magnetic current distribution which is used to compute the terms of the mutual coupling matrix [Ym] representing the Mutual Coupling Network, MCN. The multiport network modeling approach for evaluation of parasitic coupling among single and coupled microstrip discontinuities is presented in this paper. Results of parasitic coupling caused by coupled microstrip line discontinuities are given in this paper.
  • Keywords
    Computer networks; Coupling circuits; Current distribution; Dielectrics; Distributed computing; Electromagnetic radiation; Microstrip components; Mutual coupling; Transmission line matrix methods; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1993. 23rd European
  • Conference_Location
    Madrid, Spain
  • Type

    conf

  • DOI
    10.1109/EUMA.1993.336660
  • Filename
    4136721